High-Speed Laser Diode Test System
Our 2 µs Laser Diode Test System is ready.
The system is based on PXI technology
to be flexible for all future demands.
•4-quadrant operation (supports current source and sink)
•No external power source is required
•Different voltage ranges from 10 V to 60 V
•6 current ranges from 10 µA to 1 A
•Integrated measurement unit for voltage and current
•8 digital I/Os
•Very high slew rate for fast pulses
•Digitizing and Arbitrary Waveform Generator option
The potential-free PXI SMUs of the PX/PXS family are characterized by the four-quadrant operation (4Q operation) and the high slew rate. They can therefore be used flexibly as a quick source or sink.
The current voltage and the current can be read back statically. The digitizer option allows you to record curves.
The arbitrary generator option enables the generation of dynamic voltage and current curves.
If required, external devices or relays can be activated via digital I/Os.
|Device PX7731 with ±10 V / ±1.00 A
|Device PX7732 with ±20 V / ±0.50 A
|Device PX7733 with ±30 V / ±0.40 A
|Device PX7734 with ±40 V / ±0.25 A
|Device PX7736 with ±60 V / ±0.20 A
|Arbitrary waveform generator option
|Second power range: ±20 V / ±0.50 A
|Second power range: ±30 V / ±0.40 A
|Second power range: ±40 V / ±0.25 A
|Second power range: ±60 V / ±0.20 A
|Measurement for signals less than 10% of selected range with same precision