Generate extremely short, fully regulated current pulses from 100 µs up to 100 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
•Output current up to 100 A in pulse mode
•Programmable output voltage up to 50 V
•Pulse length starting at 100µs
•Extremely low noise with linear output stage
•Programmable current pulse
•Integrated current measurement unit
•Integrated voltage measurement unit
•Integrated LAN, GPIB and USB interface
•Front touch display available
•Optional: integrated isolated voltage measurement unit
The potential-free high-current SMUs of the AXC family are characterized by their very fast, low-noise analogue power amplifiers. This allows fully regulated current pulses to be realized under one millisecond at peak currents above 100 A.
Functions such as the start of a pulse can be activated by hardware triggers and thus guarantee very short response times. The throughput in the test procedure is significantly increased and at the same time less energy is introduced into the component to be tested. This leads to less heating in the component itself, which is crucial, for example, for the test of bare dies.
The extremely compact design of the devices in 19“ format with only 6 U saves space in the test system.
|100 A / 50V / 2 ms
|100 A / 40V / 8 ms
|USB 2.0 interface
|External PCIe interface
|Front touch display
|High resolution voltage measurement
|19″ rack mounting kit